专利名称:Method for manufacturing a die assembly
having a small thickness and die assemblyrelating thereto
发明人:Giorgio Allegato,Marco Ferrera,Matteo
Garavaglia,Lorenzo Corso
申请号:US14524661申请日:20141027公开号:US09327964B2公开日:20160503
专利附图:
摘要:A method for manufacturing a die assembly, including the steps of: bonding a
first wafer of semiconductor material to a second wafer, the second wafer including arespective semiconductor body having a respective initial thickness and forming anintegrated electronic circuit; and subsequently reducing the initial thickness of thesemiconductor body of the second wafer; and subsequently bonding the second wafer toa third wafer, the third wafer forming a micro-electromechanical sensing structure.
申请人:STMicroelectronics S.r.l.
地址:Agrate Brianza IT
国籍:IT
代理机构:Seed IP Law Group PLLC
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