专利名称：X-ray inspection device发明人：SHIMADA, Masahiro申请号：EP10165295.6申请日：20100608公开号：EP2261645A1公开日：20101215
专利附图：
摘要：An X-ray inspection device includes an X-ray detecting unit, a determining unit,and an output unit. The X-ray detecting unit is configured and arranged to detect a levelof X-rays passing through an article. The determining unit is configured to determine astate of the article based on a detection level of the X-rays detected by the X-ray
detecting unit using a plurality of thresholds including a first threshold and a secondthreshold for a single determination criterion. The output unit is configured and arrangedto output a result of determination made by the determining unit.
申请人：Ishida Co., Ltd.
地址：44 Sanno-cho Shogoin Sakyo-ku Kyoto-shi Kyoto 606-8392 JP
国籍：JP
代理机构：Kastel, Stefan
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