TESTING COINS

专利名称：TESTING COINS发明人：PIER DUBEY申请号：AU7797181申请日：19811127公开号：AU7797181A公开日：19820610

摘要：The coins (37) come within the coil field of an oscillator (2,6,7). Within a reversefeedback path of the oscillator amplifier (2), several resistances (11 to 18) are arranged,switchable parallel to each other individually or in any desired combination, by switchingtransistors (21 to 28), each controlled by a program (29). This makes the amplificationcontrollable step by step. The program (29) has a constant-value-storage (49) with astored standard value for the amplification in which oscillations cease whenever the fieldcoil area is free and a calibrating resistance (35) is connected parallel to the condenser (7)of the oscillator (2,6,7). For each coin type, two pre-determined standard limit values ofamplification are stored in the constant-value-storage (49), with the oscillations ceasingbetween them in the presence of an acceptable coin (37). Prior to each testing operation,the program (29), with calibrating resistance (35) being connected parallel to thecondenser (7) increases the amplification step by step until oscillations cease. Thequotient of the thus obtained amplification value and the standard value is multiplied bythe two standard limit values of each type of coin, and the product is stored in the read-write-memory (59) as the nominal limit value. During the coin testing, the amplification isaltered step by step from the highest nominal limit value to the next lower, and so on. Acoin acceptance signal is issued whenever the oscillator oscillations do not cease with the

higher of the two nominal limit values and do stop with the lower of the two nominal limitvalues.

申请人：AUTELCA AG.

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